HED-G5000具备模拟人体放电模式(Human-Body Model，HBM)和机器放电模式(Machine Model,MM)的能力，以测试和评估封装级半导体元器件的抗ESD能力及等级，同时还支持闩锁测试(Latch-up)。
● 支持最大2048个测试通道;模块化设计，允许在客户现场完成配置升级;
● 特殊的接地设计带来超低的寄生电容，符合ANSI/ESDA/JEDEC JS-001-2023对于低寄生电容设备的要求;
● 满足所有静电测试标准,JEDEC，ANSI/ESDA/JEDEC JS-001-2023，AEC,MIL-STD-883,GJB等;
● Adaptable to the following international standard waveform;ESDA_JEDEC JS-001(AEC), JEITA
● This system' s uniquely short discharge circuit is made possible by its original mechanicaldesign. The short circuit minimizes the influence of inductance and capacitance on thedata. Further, the use of a single circuit ensures data stability for each device pin tested.
| Design Base | Mechanical |
| Matrix | No relay system |
| Test Model | HBM, MM, & Latch Up Customize Available |
| Test Level | HBM:10V to 8kV step 5V MM:10Vto 4kVstep 5V Latch Up:100V/1A, 35V/1A |
| Latch Up | JESD78 with Vector Option |
| Vector | 10MHz max, 0.5-5V, 256kdepth, |
| Pin count | Max2048 Customize Available |
| Dimensions | 200cm(W)x105cm(D)x150cm(H)Depend on System |
| Weight | 500kg |
| Operation System | Windows |
| AC Voltage | 100 -240V/20A |
| Bias Supply and Current Pulse | Bias Supply:35V/1A, Min Step Voltage 0.1V |
| For Latch-Up Test(512pins) | Current Pulse:10mA-1000mA, Min Step Current 10mA |
条件
测量
Graph mode
支持最大2048个测试通道;模块化设计，允许在客户现场完成配置升级;
特殊的接地设计带来超低的寄生电容，符合ANSI/ESDA/JEDEC JS-001-2023对于低寄生电容设备的要求;
满足所有静电测试标准,JEDEC，ANSI/ESDA/JEDEC JS-001-2023，AEC,MIL-STD-883,GJB等;
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