

Full modularity and flexibility
Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C
● Smaller footprint
● Noise level < 50 dB
● Redesigned oven
● New CTE module with improved resolution
● OCT sensor enabling nano-resolution measurement on transparent, semitransparent, and glossy surfaces
● Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C
| MEASUREMENT TECHNOLOG | PHASE SHIFT PROJECTION MOIRÉ |
| CAMERA RESOLUTION | 12 mpixel |
| DATA ACQUISITION | 2 second |
MAX SAMPLE SIZE | 400 x 700 mm |
MIN SAMPLE SIZE | 0.5 x 0.5 mm |
MAX TEMPERATURE | 400°C |
MIN TEMPERATURE | -65°C (or room temp if no subroom module) |
MAX HEATING RATE | 5°C/S on typical 14 x 14 x 1.2 mm package |
MIN COOLING RATE | -3°C/S on typical 14 x 14 x 1.2 mm package |
HOMOGENEITY (*) | <+/-5°C on 12’’ silicone wafer in range (-65, 250°C) |
FOV 10 | FOV 30 | FOV 90 | FOV 150 | FOV 300 | |
FOV SIZE (mm x mm) | 10 x 12 | 30 x 37 | 90 x 110 | 150 x 187 | 300 x 375 |
MAX AMPLITUDE (mm) | 4 | 15 | 15 | 25 | 30 |
Z RESOLUTION (µm) | <1µm | 1µm | 1,5µm | 2µm | 2,5µm |
ACCURACY | <1µm + 2% | 1µm + 2% | 1,5µm + 2% | 2µm + 2% | 2,5µm + 2% |
DENSITY (px/mm2) | 90 000 | 10 000 | 1 100 | 400 | 100 |
STRAIN / CTE MODULE | For all FOVs from -65°C to 400°C |
OCT MODULE new | Interferometry nanometer resolution |
SUBROOM | For all FOVs from -65°C to 400°C |
SCANNING INCLUDED* | For FOV 10, 30 and 70 on the full 300 x 375 area |
MULTISCALE INCLUDED* | For all FOVs |
FOOT PRINT L x W x H | 1620 mm x 900 mm x 1950 mm |
WEIGHT | 575 kg |
ELEC. FACILITIES | 400 V, 3 phases, 75 amps |
AIR REQUIREMENTS | Compressed air and exhaust |
* Included in standup package