● 上下双面加热;
● PID独立调控上下面温度,温差小;
● 非连续面测试;
● BGA免去球测试;
● Warpage与CTE可同时测试;
● 高分辨率相机1200万像素;
● 可同时测试不同器件。
Full modularity and flexibility
Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C
● Smaller footprint
● Noise level < 50 dB
● Redesigned oven
● New CTE module with improved resolution
● OCT sensor enabling nano-resolution measurement on transparent, semitransparent, and glossy surfaces
● Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C
Full modularity and flexibility
● Precise warpage and CTE measurement on a micron scale across temperature range of RT to 300°C
● Scanning and multiscale available
Full modularity and flexibility
● Precise warpage and CTE measurement on a micron scale across temperature range of RT to 300°C
● Scanning and multiscale available