VUE400-P高清成像超过了现代标准，为半导体制造设施提供优质的失效分析功能。基于当前的平台和行业反馈，ODIS是最新的声学显微镜软件，具有丰富的技术内容。通过定量软件功能提供高级分析，适用于零件的测量和分类。

0DIS的离线分析版本允许客户在非扫描计算机下进行虚拟扫描、以便客户查看和分析数据，实时分析或收集数据和审查结果。

VUE 250-P 高清成像超过了现代标准，为半导体制造设施提供 优质的失效分析功能。 基于当前的平台和行业反馈，ODIS是最 新的声学显微镜软件，具有丰富的技术内容。通过定量软件功能 提供高级分析，适用于零件的测量和分类。

ODIS 的离线分析版本允许客户在非扫描计算机下进行虚拟扫 描、以便客户查看和分析数据，实时分析或收集数据和审查结 果。

MACROVUE-P imaging power surpasses modern standards deliveringpremium FA Lab features to semiconductor fabrication facilities.

ODIS is the latest Acoustic Microscopy Software with rich technicalcontent built on current platforms and industry feedback. Advanced analy-sis is provided through quantitative tools for measurement and classifica-tion of parts.

The Analysis version of ODlIS allows non-scanning computers to virtuallyscan, view, and analyze data for simultaneous real-time analysis or postcollection review.

●　PCI Express Bus Interface

●　8 bit Resolution

●　125 mV to 2V input range

●　Oscilloscope Software

●　Configurable as 1 Channel @3 GHz or 2 Channels @ 3 GHz

●　Software Development Kit C/C++, C# and VB

●　Each transducer is offered at various focal lengths

●　Standard focal lengths are 2, 3, 4, 5.9, 6, 7, 8, 10.2, 12.7, and 15 mm

●　High frequency transducers focal lengths range from 2 to 10 mm

●　Low frequency transducers focal lengths range from 6 to15 mm

●　40mm and other custom lengths are available

●　MUF probe available in 6, 9, and 11 mm